A-D transforming device, testing unit and its method


Application Number: 00108325
Application Date: 2000.03.24
Publication Number: 1268671
Publication Date: 2000.10.04
Priority Information: 2000/2/29 JP 54335/00; 1999/3/24 JP 80118/99
International: G01R19/25;G01R31/26;H03M1/12
Applicant(s) Name: Adavantest Corp.
Address:
Inventor(s) Name: Kawabata Masayyuki
Patent Agency Code: 31100
Patent Agent: li xiang
Abstract Analog-to-digital (A-D) converting apparatus (100, 120, 130) for calibrating a time error includes: an analog signal input portion (10); a plurality of analog-to-digital converters (12); a sampling clock signal generator (14) which supplies either a synchronous sampling clock signal or an alternate sampling clock signal; an averaging processing unit (18b) which performs the averaging process on a digital signal output from the A-D converters, based on the synchronous sampling clock signal; and an interleave processing unit (118a) which interleaves a digital signal output from the sampling operated A-D converters, based on the alternate sampling clock signal. The A-D converting apparatus includes an error calculation unit (72) for calculating the time error, and an error calibration value calculating unit (74) and an error calibrating unit (70b) which performs calibration operation. Method of calibrating an error caused between a plurality of the A-D converters.