Apparatus and method for detecting electric trace by using photoelectric effect

Application Number: 00107068
Application Date: 2000.04.27
Publication Number: 1305111
Publication Date: 2001.07.25
Priority Information: 1999/12/15 US 09/461,801
International: G01R31/265;G01R31/02
Applicant(s) Name: Maniya Taik Corp.
Inventor(s) Name: Mario A. Kugini
Patent Agency Code: 11038
Patent Agent: zhang zhaodong
Abstract A tester for electrical traces such as on a circuit board includes an electromagnetic beam source such as a laser producing an ultraviolet beam, a vacuum chamber, an electrode circuit including electrodes and corresponding electronics including ammeters for measuring photoelectron flow between traces and electrodes, a controller, laser beam optics, an image acquisition system, and a pair of broadband UV lights. The board containing traces under test is disposed in the vacuum chamber at lowered pressure with grid electrodes lying close to the trace area on each side of the board. Electrode electronics selectively maintain a known potential on each electrode. The exact location of traces is determined by an image acquisition system.