Device for metering reflectivity of synchronously radiating X rays from multi-layer membrane


Application Number: 00102966
Application Date: 2000.03.10
Publication Number: 1313507
Publication Date: 2001.09.19
Priority Information:
International: G01J3/12
Applicant(s) Name: Inst of High-Energy Physics, Chinese Academy of Sciences
Address:
Inventor(s) Name: Cui Mingqi;Xue Song
Patent Agency Code: 11021
Patent Agent: zhu jingui
Abstract A multi-layer membrane reflectivity metering device for synchronously radiating X ary is disclosed. A single mulit-layer membrane reflector is used as dispersion element. Its main body is composed of two Bragg diffactometers. The first diffractometer consists of monochromator and servo rockerarm. The second diffractometer consists of specimen and detector. Its advantages include simplified system, high transmission efficiency and light flux of light source, compact structure as whole system is in a vacuum cavity, and low cost.