Semiconductor device contg. macro and its test method


Application Number: 00109029
Application Date: 2000.06.02
Publication Number: 1276533
Publication Date: 2000.12.13
Priority Information: 1999/6/4 JP 158749/1999
International: G01R31/26;G01R31/28;H01L21/66
Applicant(s) Name: NEC Corp.
Address:
Inventor(s) Name: Otsuka Shigekazu
Patent Agency Code: 11219
Patent Agent: mu dejun
Abstract A semiconductor device includes a common bus (5) and a plurality of macros (1, 2, 3) connected in series by connections (L00, L01,…, L33). Each of the macros is constructed by an internal circuit (11, 21, 31), a buffer (12, 22, 32) connected between an input of the internal circuit and the common bus, a register (13, 23, 33) connected to the common bus, and a logic circuit (14, 24, 34) for selecting one of an output signal of the internal circuit and an output signal of the register.