Semiconductor storage device and method for fetch said device in test pattern

Application Number: 00108109
Application Date: 2000.04.28
Publication Number: 1272696
Publication Date: 2000.11.08
Priority Information: 1999/5/4 KR 16008/99
International: G01R31/28;H01L21/66;H01L27/10
Applicant(s) Name: Samsung Electronics Co., Ltd.
Inventor(s) Name: So Byong Sai;So Chin Ho
Patent Agency Code: 11105
Patent Agent: ma ying
Abstract A semiconductor memory device is disclosed that programmably varies an output pin transmitting output data from a comparator during a test mode. Also disclosed is a read method for the test mode. The semiconductor memory device includes a comparator that compares a plurality of output data read from the memory cell array and an output pin determining unit that programmably varies a pin transmitting an output of the comparator during the test mode. Thus, when multiple semiconductor memory devices are installed in a single memory module, the output pins of the semiconductor memory devices are variously determined using the output pin determining unit so that data can be simultaneously read from more than one semiconductor memory device at a time during a test of a memory module, to thereby reduce the module test time.