Tag Archives: parameters

Structure of transistor having parameters capable of adjusting independently, and process integration

Application Number: 00120498Application Date: 2000.07.12Publication Number: 1286495Publication Date: 2001.03.07Priority Information: 1999/7/22 US 09/359,291International: H01L21/265;H01L21/336;H01L21/82;H01L29/786Applicant(s) Name: IBM Corp.Address: Inventor(s) Name: L. Divacaruny;J.P. Gambino;J.A. MandelPatent Agency Code: 11038Patent Agent: wang yonggangAbstract The process rules for manufacturing semiconductor devices are modified to provide dual work-function doping, greatly reducing thermal budget and boron penetration concerns. The method also relaxes… Read More »

Hierarchical monitor method for parameters of oil recovering layer in oil well

Application Number: 00123076Application Date: 2000.10.10Publication Number: 1289889Publication Date: 2001.04.04Priority Information: International: E21B47/00;E21B47/06Applicant(s) Name: Well Logging Co, Daqing Petroleum AdministrationAddress: Inventor(s) Name: Chen Guohua;Li Jianhao;Zou DefuPatent Agency Code: 23100Patent Agent: li yunxiaAbstract A hierarchial monitor method for the parameters of oil recovering layes in oil well features that the hierarchical pressure-measing segment of pressure-measuring cabin is… Read More »

Combined sensor assembly for measuring several parameters of gas and liquid fluid inside pipe

Application Number: 00111249Application Date: 2000.07.28Publication Number: 1336536Publication Date: 2002.02.20Priority Information: International: G01D11/00;G01F1/34Applicant(s) Name: Resource &. Environment Engineering College, Shandong Science &. Technology UnivAddress: Inventor(s) Name: Zou Deyun;Cui Jianming;Tan YunzhenPatent Agency Code: 00000Patent Agent: Abstract A signal initiator and sensor module for fluid parameter used in gas and liquid pipe. Its characteristics are as follows. The… Read More »

Method and device for measuring mechanical parameters of laser

Application Number: 00112403Application Date: 2000.07.15Publication Number: 1334443Publication Date: 2002.02.06Priority Information: International: G01D21/00Applicant(s) Name: Chinese Science and Technology UinvAddress: Inventor(s) Name: Li YinmeiPatent Agency Code: 34103Patent Agent: zhao wulanAbstract A method for measuring the mechanical parameters of laser is disclosed. A continuous TEMoo-mode laser beam is emitted via coupler into a lens with strong convergent effect… Read More »

Detection method and system for inner and outer video camera parameters of virtual studio

Application Number: 00113050Application Date: 2000.06.23Publication Number: 1275022Publication Date: 2000.11.29Priority Information: International: H04N5/222Applicant(s) Name: Chengdu Suobei Numeral Science & Technology Co., Ltd.Address: Inventor(s) Name: Yao Ping;Luo DeyuanPatent Agency Code: 51100Patent Agent: feng zhongliangAbstract Identification mark with the same color hue and the different color saturation degree as that in background is set on the blue screen… Read More »

Method and equipment of detecting optical far field parameters of optical system

Application Number: 00116390Application Date: 2000.06.08Publication Number: 1274842Publication Date: 2000.11.29Priority Information: International: G01M11/02;G01N21/84Applicant(s) Name: Shanghai Inst. of Optics & Fine Mechanics, Chinese Academy of SciencesAddress: Inventor(s) Name: Xu Wendong;Sun Jielin;Lin QiangPatent Agency Code: 31002Patent Agent: li lanyangAbstract The detecting method is an optical fiber probe scanning process by setting the micropore tip of an optical fiber… Read More »

Diagnosis device for parameters of nuctual action between laser and plasma

Application Number: 00116391Application Date: 2000.06.08Publication Number: 1274079Publication Date: 2000.11.22Priority Information: International: G01J3/447Applicant(s) Name: Shanghai Inst. of Optics Fine and Mechanics, Chinese Academy of SciencesAddress: Inventor(s) Name: Tang Yuhui;Han ShenshengPatent Agency Code: 31002Patent Agent: li lanyangAbstract A device for detecting the mutual action parameters between laser and plasma has light source unit and collecting-detecting unit, which… Read More »

Inverting power supply for luminous license plate of car and method for optimizing parameters of elements

Application Number: 00110280Application Date: 2000.03.31Publication Number: 1315273Publication Date: 2001.10.03Priority Information: International: B60R13/10;H02M7/5383Applicant(s) Name: Shen LizhenAddress: Inventor(s) Name: Shen Lizhen;Zhu RuoPatent Agency Code: 00000Patent Agent: Abstract An inverting power supply for luminous license plate of automobile is an auto-excited multioscillator circuit composed of transistor, transformer, capacitor and resistor, is connected with the main power supply of… Read More »

Method for sharing radio packet shannels by means of QoS parameters

Application Number: 00109247Application Date: 2000.06.19Publication Number: 1330496Publication Date: 2002.01.09Priority Information: International: H04L12/56;H04Q7/22Applicant(s) Name: Zhongxing Communication Co Ltd, Shenzhen CityAddress: Inventor(s) Name: Tai Yibin;Jiang HanquanPatent Agency Code: 72003Patent Agent: chen gongAbstract A method for sharing the wireless packet channels by service quality (QoS) parameter is suitable for wireless data communication system includes such steps as converting… Read More »

Method for monitoring environmental parameters of computer system

Application Number: 00100937Application Date: 2000.01.07Publication Number: 1304069Publication Date: 2001.07.18Priority Information: International: G06F1/28Applicant(s) Name: Shenda Computer Co., Ltd.Address: Inventor(s) Name: Zheng RuiPatent Agency Code: 31100Patent Agent: shen zhaokunAbstract Firstly, fetching a environmental parameter temporary value from a system environmental parameter monitoring integrated circuit; according to the environmental parameter, converting the temporary value into actual parameter value,… Read More »

Method and system for analyzing parameters of semiconductor

Application Number: 00100121Application Date: 2000.01.12Publication Number: 1261205Publication Date: 2000.07.26Priority Information: International: G01R31/26;H01L21/66Applicant(s) Name: Beijing Univ.Address: Inventor(s) Name: Xu Mingzhen;Tan Changhua;He YandongPatent Agency Code: 11200Patent Agent: yu changjiangAbstract An analyzing method and system for semiconductor parameters by proportional-differential operators is disclosed. The I-V output charcteristics of semiconductor device are first measured by semiconductor parameter tester ,and… Read More »