Tag Archives: testing

Device for testing digital monitor

Application Number  00129573 Application Date  2000.09.29 Publication Number  1291745 Publication Date  2001.04.18 Priority Information   1999/10/6 KR 43061/1999   International Classification  G06F11/00   Applicant(s) Name  LG Electronics Inc.   Address     Inventor(s) Name  Chon Jong-Chin   Patent Agency Code  11219 Patent Agent  yu mang AbstractA device for testing a digital monitor includes a Field… Read More »

Human hand movement image 3D real time testing method

Application Number  00129552 Application Date  2000.10.09 Publication Number  1285504 Publication Date  2001.02.28 Priority Information     International Classification  G01D21/00   Applicant(s) Name  Qinghua Univ.   Address     Inventor(s) Name  Huang Changhua;Wang Rencheng;Liao Ke eta l.   Patent Agency Code  11201 Patent Agent  luo wenqun AbstractThe three-dimensional real-time detection method of human hand movement image… Read More »

Method for testing carbon type of high-arylhydrocarbon oil for oil-extended rubber

Application Number  00129367 Application Date  2000.11.29 Publication Number  1355430 Publication Date  2002.06.26 Priority Information     International Classification  G01N21/35;G01N30/02;G01N30/72;G01N35/00   Applicant(s) Name  Qilu Petro-Chemical Co, China Petro-Chemical Group   Address     Inventor(s) Name  Yue Xiuying;Hu Kongcheng;Wang Jing   Patent Agency Code  37103 Patent Agent  geng xia AbstractA method with combination of stoichiometry and infrared… Read More »

Intrustment with multi-channel telecommunication time scales testing and measuring capacibility

Application Number  00129020 Application Date  2000.09.25 Publication Number  1290079 Publication Date  2001.04.04 Priority Information   2000/7/19 US 09/619067; 1999/9/24 US 60/155977   International Classification  H04B17/00   Applicant(s) Name  Tektronix Inc.   Address     Inventor(s) Name  P.J. Leiz;S.C. Herling   Patent Agency Code  72001 Patent Agent  wang yue AbstractIn a test and measurement instrument having… Read More »

Instrument with focus variable characteristics for testing and measuring capacibility of telecommunication time scales test

Application Number  00129019 Application Date  2000.09.25 Publication Number  1290078 Publication Date  2001.04.04 Priority Information   2000/6/29 US 09/607573; 1999/9/24 US 60/155977   International Classification  H04B17/00   Applicant(s) Name  Tektronix Inc.   Address     Inventor(s) Name  P.J. Leiz   Patent Agency Code  72001 Patent Agent  wang yue AbstractA telecom mask testing zoom function draws mask… Read More »

Instrument with self adaptable time scales characteristics for testing and measuring capacibility of telecommunication time scales test

Application Number  00129018 Application Date  2000.09.25 Publication Number  1290077 Publication Date  2001.04.04 Priority Information   2000/6/22 US 09/602575; 1999/9/24 US 60/155977   International Classification  H04B17/00   Applicant(s) Name  Tektronix Inc.   Address     Inventor(s) Name  P.J. Leiz   Patent Agency Code  72001 Patent Agent  wang yue AbstractInitial mask and waveform positions on a display… Read More »

Optimizing chemical-mechanical planing process by testing oxide/nitride interface

Application Number  00128638 Application Date  2000.09.18 Publication Number  1296177 Publication Date  2001.05.23 Priority Information   1999/9/30 US 09/409,243   International Classification  B24B37/04;G01N21/76;H01L21/304   Applicant(s) Name  IBM Corp.   Address     Inventor(s) Name  Li Leping;James A. Gillhuli;Kelifude O. Mogen   Patent Agency Code  11038 Patent Agent  du rixin AbstractA slurry is added to a polishing… Read More »

Probe card for testing semiconductor chip with many semiconductor device and method thereof

Application Number: 00120070Application Date: 2000.07.05Publication Number: 1285615Publication Date: 2001.02.28Priority Information: 1999/8/19 JP 233109/1999International: G01R1/067;G01R31/26;H01L21/66Applicant(s) Name: Fujitsu Ltd.Address: Inventor(s) Name: Maruyama Shigeyuki;Watanaba NaoyukiPatent Agency Code: 11038Patent Agent: du rixinAbstract A probe card for testing a wafer including a board and a multi-layer substrate. The probe card may also include a flexible substrate. A contact electrode, located… Read More »

Integrated instrument for designing ASIC chip, analoging by combining software with hardware and testing it

Application Number: 00113352Application Date: 2000.04.03Publication Number: 1316694Publication Date: 2001.10.10Priority Information: International: G06F11/00Applicant(s) Name: National Defense Science and Technology Univ, PLAAddress: Inventor(s) Name: Chen Shuming;Lu Guangzhao;Sun YongjiePatent Agency Code: 43008Patent Agent: zhao hongAbstract An integrated instrument for simulating the design of ASIC chip by cooperation of software and hardware and testing the ASIC chip is disclosed,… Read More »

Frequency expansion code testing method for byatt channel testing circuit, and ciruit thereof

Application Number: 00124755Application Date: 2000.09.13Publication Number: 1288308Publication Date: 2001.03.21Priority Information: 1999/9/14 JP 259705/1999International: H04J13/00;H04Q7/34Applicant(s) Name: NEC Corp.Address: Inventor(s) Name: Komeyama TsunePatent Agency Code: 11219Patent Agent: mu dejunAbstract To eliminate the need for timing control between base stations by means of a wide band CDMA system and to detect spreading codes, even if plural base stations… Read More »

Optical apparatus for testing material and coordinate inputting equipment using it

Application Number: 00118347Application Date: 2000.06.12Publication Number: 1277349Publication Date: 2000.12.20Priority Information: 1999/6/10 JP 164123/99International: G01C1/00;G01C3/00Applicant(s) Name: Newcome Co., Ltd.Address: Inventor(s) Name: Murakami Akira;Ogawa Yasuji;Fukusaki YasuhiroPatent Agency Code: 72001Patent Agent: wu zengyongAbstract An object detecting optical unit (1;30) for detecting a direction or a position of an object (33) placed on a detecting plane surface (31) is… Read More »

Method for testing imperfect contact caused by tiny short circuit on conducting wire

Application Number: 00120180Application Date: 2000.07.20Publication Number: 1281990Publication Date: 2001.01.31Priority Information: 1999/7/21 KR 29474/99International: G01R31/02Applicant(s) Name: Yulim Technology Co., Ltd.Address: Inventor(s) Name: Kim Sang-HwanPatent Agency Code: 11105Patent Agent: ma yingAbstract There is no effective resolvent for testing and diagnosing instantaneous imperfect contact caused by tiny short circuit. The object of the present invention is to provide… Read More »

Integrated method for analoging and testing ASIC chip by combining software with hardware

Application Number: 00113353Application Date: 2000.04.03Publication Number: 1316695Publication Date: 2001.10.10Priority Information: International: G06F11/00Applicant(s) Name: National Defense Science and Technology Univ, PLAAddress: Inventor(s) Name: Chen Shuming;Sun Yongjie;Yu ZaixiangPatent Agency Code: 43008Patent Agent: zhao hongAbstract An integrated method for simulating and testing ASIC design by the cooperation of hardware and software is based on "existing-response" principle, and features… Read More »

Universal user board testing equipment

Application Number: 00125746Application Date: 2000.10.18Publication Number: 1349329Publication Date: 2002.05.15Priority Information: International: H04L12/02;H04L12/26Applicant(s) Name: Shanghai No.2 Inst., Zhongxing Communication Co., Ltd., ShenzhenAddress: Inventor(s) Name: Zhang Liyong;Li Zhuangzhi;Wen HaijunPatent Agency Code: 44217Patent Agent: guo weigangAbstract The bus unit is connected to master control board with flush type microprocessor, signal source and signal processing unit, multi-function board with… Read More »

Equipment for testing experimentaly the inter-reaction between ground and rubber specimen

Application Number: 00118751Application Date: 2000.06.26Publication Number: 1288155Publication Date: 2001.03.21Priority Information: 1999/6/26 EP 99202074.3International: G01M17/02;G01N19/02Applicant(s) Name: Pirelli Coordinamento Pneumatici S.P.A.Address: Inventor(s) Name: Antonio Saila;Alesandro VolpiPatent Agency Code: 11038Patent Agent: sun zhengAbstract The invention relates to an apparatus for testing tire compounds, which comprises a road drum (3) and a specimen (5), rotating about respective parallel axes… Read More »

Ultrasonic method and equipment for testing resistance of material to corrosion and abrasion

Application Number: 00120721Application Date: 2000.07.14Publication Number: 1334455Publication Date: 2002.02.06Priority Information: International: G01N3/56;G01N5/00;G01N17/00;G01N29/00Applicant(s) Name: Inst of Mechnics, Chinese Academy of SciencesAddress: Inventor(s) Name: Li Chengming;Zhang Yong;Cao EryanPatent Agency Code: 31002Patent Agent: gao cunxiuAbstract An ultrasonic method for testing the resistance of material to corrosion and abration is disclosed. Its equipment is composed of ultrasonic generator and… Read More »

Computerized physiological function testing system

Application Number: 00113392Application Date: 2000.04.26Publication Number: 1320864Publication Date: 2001.11.07Priority Information: International: A61B5/00;G06F13/00;G06F15/00Applicant(s) Name: Shen YuanyaoAddress: Inventor(s) Name: Shen YuanyaoPatent Agency Code: 43113Patent Agent: wei guoxianAbstract A computerized physiological function measuring system is composed of a computer able to receive measured data of physiological function and a measuring meter able to contact with human skin and… Read More »

Electric motor driving unit, and method for testing fault of electric motor driving unit

Application Number: 00126338Application Date: 2000.09.07Publication Number: 1287930Publication Date: 2001.03.21Priority Information: 1999/9/7 JP 252593/99International: B60L15/08;H02P5/17Applicant(s) Name: Toyota Jidosha K.K.Address: Inventor(s) Name: Kasai Eiji;Fujita ShujiPatent Agency Code: 72001Patent Agent: luo pengAbstract A DC motor is connected to diagonal positions of a bridge circuit having four sides including switching elements and reflux diodes. At least one of two… Read More »

Scheme for disolving signal sluggish in solid testing device

Application Number: 00118829Application Date: 2000.04.30Publication Number: 1287824Publication Date: 2001.03.21Priority Information: 1999/4/30 US 09/302603International: A61B6/03;G01N21/00;G06T1/00Applicant(s) Name: General Electric Co.Address: Inventor(s) Name: J. HessPatent Agency Code: 72001Patent Agent: wang zhongzhongAbstract The present invention, in one form, includes a digital x-ray imaging system which, in one embodiment, collects projection data from a plurality of views and reduces artifacts… Read More »

High efficiency HPLC method used for testing Log P value

Application Number: 00120935Application Date: 2000.08.04Publication Number: 1288157Publication Date: 2001.03.21Priority Information: 1999/8/4 US 60/147093International: G01N30/02;G01N30/22Applicant(s) Name: Anwant Corps Sciences Corp.Address: Inventor(s) Name: Alay Azmi AbediPatent Agency Code: 11021Patent Agent: hu jiaoyuAbstract Methods for calculating Log P values for organic compounds are disclosed. The methods allow identification of compounds in a library with a desired Log P… Read More »

Method for testing sealing of corrugation expansion joint being beared with external pressure and apparatus thereof

Application Number: 00113598Application Date: 2000.08.07Publication Number: 1501057Publication Date: 2004.06.02Priority Information: International: G01M3/04Applicant(s) Name: Hunan Zixing City East House Mechanical & Electronical Manufacturing Co., Ltd.Address: Inventor(s) Name: Jin Jiesheng;Li Gengwu;Li XiaohongPatent Agency Code: 43008Patent Agent: zhao hong huang zibengAbstract The present invention is outside pressurizing seal test method and device for corrugated expansion bend. The interval… Read More »

Charge system, convenient terminal, and method for maintaining and testing charge system

Application Number: 00126433Application Date: 2000.08.29Publication Number: 1286455Publication Date: 2001.03.07Priority Information: 1999/8/30 JP 244064/1999International: G07B15/00Applicant(s) Name: K.K. ToshibaAddress: Inventor(s) Name: Naito Kazutoshi;Matsuyama Hiroichi;Machiyama YasukiyoPatent Agency Code: 11038Patent Agent: wang maohuaAbstract A system to make a toll collection through a wireless communication with an on board unit (OBU) installed to a vehicle includes plural equipment including a… Read More »

Testing method for electronic component

Application Number: 00118979Application Date: 2000.07.05Publication Number: 1281991Publication Date: 2001.01.31Priority Information: 1999/7/5 FR 9909055International: G01R31/26;G01R31/28Applicant(s) Name: Softrink S.A.Address: Inventor(s) Name: Philip LeyounnePatent Agency Code: 11038Patent Agent: wang maohuaAbstract A method for the testing of electronic components comprises an interface driving a test device. The interface can be parameterized according to the test. The test method provide… Read More »

Optical method and instrument for testing pins of integrated circuit

Application Number: 00121569Application Date: 2000.08.14Publication Number: 1297136Publication Date: 2001.05.30Priority Information: International: G01B11/02;H01L21/66Applicant(s) Name: Wang TongyiAddress: Inventor(s) Name: Wang TongyiPatent Agency Code: 22206Patent Agent: wang dazhuAbstract A 3D-space optical method and instrument for detecting the pins of integrated circuit (IC) features that the autocontrolled shifter, laser source, splitter, laser spot detector, and position sensing system are… Read More »

Signal source and method for testing broad-band CDMA system

Application Number: 00114087Application Date: 2000.03.01Publication Number: 1306382Publication Date: 2001.08.01Priority Information: International: H04Q7/34Applicant(s) Name: Zhongxing Communication Co Ltd, Shenzhen CityAddress: Inventor(s) Name: Tian Wanting;Zhao Guofeng;Ren ZhenPatent Agency Code: 00000Patent Agent: Abstract A testing method and signal source of the base-strip receiving module is used to test the baseband receiving module of WCDMA movable station. The signal… Read More »

Money award counting system and method for knowledge testing

Application Number: 00126804Application Date: 2000.08.29Publication Number: 1315704Publication Date: 2001.10.03Priority Information: 2000/3/24 JP 83386/00International: G06F15/173Applicant(s) Name: K.K. PourkrosAddress: Inventor(s) Name: Ohara YoshigenPatent Agency Code: 31100Patent Agent: shen zhaokunAbstract The invention relates to providing of a quiz program utilizing the internet and, particularly, it allows the payment of a participation charge and the remittance of prize money… Read More »

Unbalanced roll mass testing method for roll-type washing machine

Application Number: 00119059Application Date: 2000.10.24Publication Number: 1350166Publication Date: 2002.05.22Priority Information: International: G01M1/14Applicant(s) Name: Jiangsu Chunlan Washing Machinery Co., Ltd.Address: Inventor(s) Name: Ma Baohe;Xia Houqin;Zhang YoupingPatent Agency Code: 32206Patent Agent: gu baxinAbstract The present invention discloses a method for detecting drum unbalanced quality of drum washing machine, which is characterized by that according to the error… Read More »

Device for testing aggregate integrity

Application Number: 00123506Application Date: 2000.08.16Publication Number: 1285303Publication Date: 2001.02.28Priority Information: 1999/8/20 DE 19939669.8International: B65B19/30Applicant(s) Name: Topack Verpackungstechnic GmbHAddress: Inventor(s) Name: Welk vanhoff;Manfred GebaoerPatent Agency Code: 72002Patent Agent: cheng kunAbstract This present invention provides a method and equipment for detecting the completeness of a bundle body made of an article related to the tobacco processing industry,… Read More »

Method for testing photochromic characteristics of ink

Application Number: 00115502Application Date: 2000.04.27Publication Number: 1320811Publication Date: 2001.11.07Priority Information: International: G01J3/46Applicant(s) Name: Shanghai Paper Money Printing HouseAddress: Inventor(s) Name: Chen Biao;Wang HongboPatent Agency Code: 31100Patent Agent: chang mengAbstract A method for testing the photochromic characteristics of ink uses the chromatometer as a detector. When the colour is detecting a distance between the chromatometer and… Read More »

Semiconductor integrated circuit and method for testing characteristics

Application Number: 00127078Application Date: 2000.09.14Publication Number: 1288160Publication Date: 2001.03.21Priority Information: 1999/9/14 JP 260677/99International: G01R31/28;H01L21/66Applicant(s) Name: NEC Corp.Address: Inventor(s) Name: Okawa ShinichiPatent Agency Code: 72001Patent Agent: wu zengyongAbstract A semiconductor integrated circuit and a method for measuring the characteristics of a semiconductor integrated circuit are disclosed, which need the minimum test terminals for measuring the characteristics… Read More »