Taper limited receiving slit


Application Number: 00112750
Application Date: 2000.03.08
Publication Number: 1264831
Publication Date: 2000.08.30
Priority Information:
International: G01N23/20
Applicant(s) Name: Chongqing Univ.
Address:
Inventor(s) Name: Zhou Shangqi;Ren Qin
Patent Agency Code: 51201
Patent Agent: zhang rongqing
Abstract A taper limited receiving slit as a part in X-ray analyzer is disclosed. The internal sleeve of said taper limited receiving slit is sleeved by a movable external sleeve in the shape same as the slit and connected to limiting piece. The relative slide between slit and external sleeve can change the active length of slit. The through hole on said limiting piece is matched with the interface of slit. Multiple layers of monocrystal chips are embedded in the internal sleeve in the taper direction. A restoring mechanism is installed to the slit. Its advantages are adjustable length, able to eliminate interference spectrum, and high accuracy.