Frame for holding investigation piece and device for removing unnecessary analyte on it

Application Number: 00102865
Application Date: 2000.03.06
Publication Number: 1266187
Publication Date: 2000.09.13
Priority Information: 1999/3/4 JP 56580/99
International: G01N1/28;G01N35/00
Applicant(s) Name: Kyoto Daiichi Kagaku Co., Ltd.
Inventor(s) Name: Nakamichi Mitsuo;Yamayuki Hideshige;Hirayama Hiroji
Patent Agency Code: 11021
Patent Agent: jiang lilou
Abstract A test piece holder (2) has an elongate top surface, and a pair of side surfaces (24) located below the top surface. The top surface is provided with a test piece holding groove (20) defined by an elongate bottom wall (21) and a pair of ridges (22) each rising from a respective longitudinal edge of the bottom wall (21). Each ridge (22) is formed with a plurality of upper capillary grooves (41) extending vertically to open into the test piece holding groove (20). The bottom wall (21) is formed with a plurality of capillary pores (42) in corresponding relationship to and in communication with the upper capillary grooves (41). The capillary pores (42) are open toward a respective one of the side surfaces (24).