Application Number | 00129020 | Application Date | 2000.09.25 |
Publication Number | 1290079 | Publication Date | 2001.04.04 |
Priority Information | 2000/7/19 US 09/619067; 1999/9/24 US 60/155977 | ||
International Classification |
H04B17/00 | ||
Applicant(s) Name | Tektronix Inc. | ||
Address | |||
Inventor(s) Name | P.J. Leiz;S.C. Herling | ||
Patent Agency Code | 72001 | Patent Agent | wang yue |
AbstractIn a test and measurement instrument having M signal input channels, detecting non-compliance with a given specification. Comparison of mask pixels and waveform pixels to detect collision between a waveform pixel and a mask pixel is performed substantially in real time, as the pixels are being composited into a raster memory by a rasterizer. Acquired waveforms from all M signal input channels are sequentially compared to the mask and drawn on screen during the following acquisition period. A system employing a multiplexer can select M channels at a time from a group of N channels to decrease the time required to test all N channels. The intensity of pixels representing samples violating the mask is preferably increased for better visibility against the telecom mask. |